User Contributed MET/CAL PROCEDURE ============================================================================= INSTRUMENT: Philips PM 2535: (90 day) CAL VER IEEE DATE: 03-Aug-92 AUTHOR: User Contributed REVISION: 2.0 ADJUSTMENT THRESHOLD: 70% NUMBER OF TESTS: 45 NUMBER OF LINES: 298 CONFIGURATION: Fluke 5700A ============================================================================= STEP FSC RANGE NOMINAL TOLERANCE MOD1 MOD2 3 4 CON 1.001 ASK- R P F W 1.002 MMFC C2 1.003 HEAD PRELIMINARY INSTRUCTIONS 1.004 DISP Toggle the PM2535 power switch "ON" (Rear of Unit). 1.005 DISP Before performing verification allow the UUT to 1.005 DISP Stabilize @ 23ñ5øC for 30 minutes. 1.006 DISP Connect the PM2535 to the IEEE-488 port 1 on the PC. 1.007 HEAD {DC VOLTS VERIFICATION} 1.008 DISP [32] Connect the 5700A and the UUT as follows. 1.008 DISP [32][27][91]1m 2-Wire Mode 1.008 DISP [32][27][91]1m 5700A TO PM 2535 1.008 DISP [32] OUTPUT V ê A HI ÄÄÄÄÄÄÄÄÄ Vê 1.008 DISP [32] OUTPUT V ê A LO ÄÄÄÄÄÄÄÄÄ COM 1.008 DISP [32] SENSE V ê HI ÄÄÄÄÄÄÄÄÄÄÄ Vê 1.008 DISP [32] SENSE V ê HI ÄÄÄÄÄÄÄÄÄÄÄ COM 1.008 DISP [32] AUX CURRENT OUTPUT HI ÄÄÄ A 1.009 IEEE [SDC] 1.010 IEEE FNC VDC 0.001,MSP 2,TRG B 1.011 5700 0.0000mV S 2W 1.012 IEEE X[I]X[I] 1.013 MATH MEM = MEM * 1000 1.014 MEME 1.015 MEMC 300 mV 0.0017/ #! Test Tol 5.1e-006, Sys Tol 7.5e-007, T.U.R. 6.800 (>= 4.00). 2.001 5700 300.0000mV S 2W 2.002 IEEE x[I]X[I] 2.003 MATH MEM = MEM * 1000 2.004 MEME 2.005 MEMC 300 mV .007% .0017/ #! Test Tol 2.61e-005, Sys Tol 3e-006, T.U.R. 8.700 (>= 4.00). 3.001 5700 -300.0000mV S 2W 3.002 IEEE x[I]X[I] 3.003 MATH MEM = MEM * 1000 3.004 MEME 3.005 MEMC 300 mV .007% .0017/ #! Test Tol 2.61e-005, Sys Tol 3e-006, T.U.R. 8.700 (>= 4.00). 4.001 IEEE RNG 3 4.002 5700 3.000000V S 2W 4.003 IEEE x[I]X[I] 4.004 MEME 4.005 MEMC 3 V .005% .0013/ #! Test Tol 0.000189, Sys Tol 1.9e-005, T.U.R. 9.947 (>= 4.00). 5.001 5700 -3.000000V S 2W 5.002 IEEE x[I]X[I] 5.003 MEME 5.004 MEMC 3 V .005% .0013/ #! Test Tol 0.000189, Sys Tol 1.9e-005, T.U.R. 9.947 (>= 4.00). 6.001 IEEE RNG 30 6.002 5700 30.00000V S 2W 6.003 IEEE x[I]X[I] 6.004 MEME 6.005 MEMC 30 V .006% .0017/ #! Test Tol 0.00231, Sys Tol 0.00028, T.U.R. 8.250 (>= 4.00). 7.001 5700 -30.00000V S 2W 7.002 IEEE x[I]X[I] 7.003 MEME 7.004 MEMC 30 V .006% .0017/ #! Test Tol 0.00231, Sys Tol 0.00028, T.U.R. 8.250 (>= 4.00). 8.001 IEEE RNG 300 8.002 5700 300.0000V S 2W 8.003 IEEE x[I]X[I] 8.004 MEME 8.005 MEMC 300 V .006% .0013/ #! Test Tol 0.0219, Sys Tol 0.003, T.U.R. 7.300 (>= 4.00). 9.001 5700 -300.0000V S 2W 9.002 IEEE x[I]X[I] 9.003 MEME 9.004 MEMC 300 V .006% .0013/ #! Test Tol 0.0219, Sys Tol 0.003, T.U.R. 7.300 (>= 4.00). 10.001 HEAD {AC VOLTS VERIFICATION} 10.002 IEEE FNC VAC 0.3 10.003 5700 300.00mV 40H S 2W 10.004 IEEE X[I]X[I] 10.005 MATH MEM = MEM * 1000 10.006 MEME 10.007 MEMC 300 mV 0.2% 0.1/ 40H #! Test Tol 0.0009, Sys Tol 8.1e-005, T.U.R. 11.111 (>= 4.00). 11.001 5700 300.00mV 400H S 2W 11.002 IEEE X[I]X[I] 11.003 MATH MEM = MEM * 1000 11.004 MEME 11.005 MEMC 300 mV 0.2% 0.1/ 400H #! Test Tol 0.0009, Sys Tol 2.95e-005, T.U.R. 30.508 (>= 4.00). 12.001 5700 300.00mV 5kH S 2W 12.002 IEEE X[I]X[I] 12.003 MATH MEM = MEM * 1000 12.004 MEME 12.005 MEMC 300 mV 0.4% 0.2/ 5kH #! Test Tol 0.0018, Sys Tol 2.95e-005, T.U.R. 61.017 (>= 4.00). 13.001 5700 300.00mV 20kH S 2W 13.002 IEEE X[I]X[I] 13.003 MATH MEM = MEM * 1000 13.004 MEME 13.005 MEMC 300 mV 1.0% 0.5/ 20kH #! Test Tol 0.0045, Sys Tol 2.95e-005, T.U.R. 152.542 (>= 4.00). 14.001 5700 300.00mV 100kH S 2W 14.002 IEEE X[I]X[I] 14.003 MATH MEM = MEM * 1000 14.004 MEME 14.005 MEMC 300 mV 4.2% 2.1/ 100kH #! Test Tol 0.0189, Sys Tol 0.000155, T.U.R. 121.935 (>= 4.00). 15.001 IEEE RNG 3 15.002 5700 3.0000V 40H S 2W 15.003 IEEE X[I]X[I] 15.004 MEME 15.005 MEMC 3 V 0.2% 0.1/ 40H #! Test Tol 0.009, Sys Tol 0.00081, T.U.R. 11.111 (>= 4.00). 16.001 5700 3.0000V 400H S 2W 16.002 IEEE X[I]X[I] 16.003 MEME 16.004 MEMC 3 V 0.2% 0.1/ 400H #! Test Tol 0.009, Sys Tol 0.000295, T.U.R. 30.508 (>= 4.00). 17.001 5700 3.0000V 5kH S 2W 17.002 IEEE X[I]X[I] 17.003 MEME 17.004 MEMC 3 V 0.4% 0.2/ 5kH #! Test Tol 0.018, Sys Tol 0.000295, T.U.R. 61.017 (>= 4.00). 18.001 5700 3.0000V 20kH S 2W 18.002 IEEE X[I]X[I] 18.003 MEME 18.004 MEMC 3 V 1.0% 0.5/ 20kH #! Test Tol 0.045, Sys Tol 0.000295, T.U.R. 152.542 (>= 4.00). 19.001 5700 3.0000V 100kH S 2W 19.002 IEEE X[I]X[I] 19.003 MEME 19.004 MEMC 3 V 4.2% 2.1/ 100kH #! Test Tol 0.189, Sys Tol 0.00115, T.U.R. 164.348 (>= 4.00). 20.001 IEEE RNG 30 20.002 5700 30.000V 40H S 2W 20.003 IEEE X[I]X[I] 20.004 MEME 20.005 MEMC 30 V 0.2% 0.1/ 40H #! Test Tol 0.09, Sys Tol 0.0081, T.U.R. 11.111 (>= 4.00). 21.001 5700 30.000V 400H S 2W 21.002 IEEE X[I]X[I] 21.003 MEME 21.004 MEMC 30 V 0.2% 0.1/ 400H #! Test Tol 0.09, Sys Tol 0.0034, T.U.R. 26.471 (>= 4.00). 22.001 5700 30.000V 5kH S 2W 22.002 IEEE X[I]X[I] 22.003 MEME 22.004 MEMC 30 V 0.4% 0.2/ 5kH #! Test Tol 0.18, Sys Tol 0.0034, T.U.R. 52.941 (>= 4.00). 23.001 5700 30.000V 20kH S 2W 23.002 IEEE X[I]X[I] 23.003 MEME 23.004 MEMC 30 V 1.0% 0.5/ 20kH #! Test Tol 0.45, Sys Tol 0.0034, T.U.R. 132.353 (>= 4.00). 24.001 5700 30.000V 100kH S 2W 24.002 IEEE X[I]X[I] 24.003 MEME 24.004 MEMC 30 V 4.2% 2.1/ 100kH #! Test Tol 1.89, Sys Tol 0.0265, T.U.R. 71.321 (>= 4.00). 25.001 IEEE RNG 300 25.002 5700 120.00V 40H S 2W 25.003 IEEE X[I]X[I] 25.004 MEME 25.005 MEMC 300 V 0.2% 0.1/ 40H #! Test Tol 0.54, Sys Tol 0.0234, T.U.R. 23.077 (>= 4.00). 26.001 5700 300.00V 400H S 2W 26.002 IEEE X[I]X[I] 26.003 MEME 26.004 MEMC 300 V 0.2% 0.1/ 400H #! Test Tol 0.9, Sys Tol 0.028, T.U.R. 32.143 (>= 4.00). 27.001 5700 120.00V 5kH S 2W 27.002 IEEE X[I]X[I] 27.003 MEME 27.004 MEMC 300 V 0.4% 0.2/ 5kH #! Test Tol 1.08, Sys Tol 0.0106, T.U.R. 101.887 (>= 4.00). 28.001 5700 120.00V 20kH S 2W 28.002 IEEE X[I]X[I] 28.003 MEME 28.004 MEMC 300 V 1.0% 0.5/ 20kH #! Test Tol 2.7, Sys Tol 0.0106, T.U.R. 254.717 (>= 4.00). 29.001 5700 100.00V 100kH S 2W 29.002 IEEE X[I]X[I] 29.003 MEME 29.004 MEMC 300 V 4.2% 2.1/ 100kH #! Test Tol 10.5, Sys Tol 0.065, T.U.R. 161.538 (>= 4.00). 30.001 HEAD {2 WIRE RESISTANCE VERIFICATION} 30.002 IEEE FNC RTW 100 30.003 5700 0.000000kZ S CW 30.004 IEEE X[I]X[I] 30.005 MATH MEM = MEM / 1000 30.006 MEME 30.007 MEMC 3 kZ 0.0033/ #! Test Tol 0.099, Sys Tol 0.00205, T.U.R. 48.293 (>= 4.00). 31.001 5700 1.900000kZ S CW 31.002 IEEE X[I]X[I] 31.003 MATH MEM = MEM / 1000 31.004 MEME 31.005 MEMC 3 kZ 0.02% 0.0033/ #! Test Tol 0.479, Sys Tol 0.0328, T.U.R. 14.604 (>= 4.00). 32.001 IEEE RNG 3E+4 32.002 5700 19.00000kZ S CW 32.003 IEEE X[I]X[I] 32.004 MATH MEM = MEM / 1000 32.005 MEME 32.006 MEMC 30 kZ 0.02% 0.0033/ #! Test Tol 4.79, Sys Tol 0.309, T.U.R. 15.502 (>= 4.00). 33.001 IEEE RNG 3E+5 33.002 5700 190.0000kZ S 2W 33.003 IEEE X[I]X[I] 33.004 MATH MEM = MEM / 1000 33.005 MEME 33.006 MEMC 300 kZ 0.02% 0.0033/ #! Test Tol 47.9, Sys Tol 2.47, T.U.R. 19.393 (>= 4.00). 34.001 IEEE RNG 3E+6 34.002 5700 1.900000MZ S 2W 34.003 IEEE X[I]X[I] 34.004 MATH MEM = MEM / 1000000 34.005 MEME 34.006 MEMC 3 MZ 0.04% 0.0033/ #! Test Tol 859, Sys Tol 36.1, T.U.R. 23.795 (>= 4.00). 35.001 IEEE RNG 3E+7 35.002 5700 19.00000MZ S 2W 35.003 IEEE X[I]X[I] 35.004 MATH MEM = MEM / 1000000 35.005 MEME 35.006 MEMC 30 MZ 0.1% 0.0033/ #! Test Tol 19990, Sys Tol 893, T.U.R. 22.385 (>= 4.00). 36.001 IEEE RNG 3E+8 36.002 5700 100.0000MZ S 2W 36.003 IEEE X[I]X[I] 36.004 MATH MEM = MEM / 1000000 36.005 MEME 36.006 MEMC 300 MZ 1.6% 0.033/ #! Test Tol 1.699e+006, Sys Tol 12000, T.U.R. 141.583 (>= 4.00). 37.001 HEAD {DC CURRENT VERIFICATION} 37.002 MMFC C2 37.003 IEEE FNC IDC 0.03 37.004 5700 30.0000mA S 2W 37.005 IEEE X[I]X[I] 37.006 MATH MEM = MEM * 1000 37.007 MEME 37.008 MEMC 30 mA 0.03% 0.005/ #! WARNING: Test Tol 1.05e-005, Sys Tol 2.8e-006, T.U.R. 3.750 (< 4.00). 38.001 IEEE RNG 3 38.002 5700 2.00000A S 2W 38.003 IEEE X[I]X[I] 38.004 MEME 38.005 MEMC 3 A 0.15% 0.01/ #! Test Tol 0.0033, Sys Tol 0.00019, T.U.R. 17.368 (>= 4.00). 39.001 HEAD {AC CURRENT VERIFICATION} 39.002 IEEE FNC IAC 0.03 39.003 5700 30.00mA 40H S 2W 39.004 IEEE X[I]X[I] 39.005 MATH MEM = MEM * 1000 39.006 MEME 39.007 MEMC 30 mA 0.2% 0.1/ 40H #! Test Tol 9e-005, Sys Tol 1.54e-005, T.U.R. 5.844 (>= 4.00). 40.001 5700 30.00mA 400H S 2W 40.002 IEEE X[I]X[I] 40.003 MATH MEM = MEM * 1000 40.004 MEME 40.005 MEMC 30 mA 0.2% 0.1/ 400H #! Test Tol 9e-005, Sys Tol 8.5e-006, T.U.R. 10.588 (>= 4.00). 41.001 5700 30.00mA 1kH S 2W 41.002 IEEE X[I]X[I] 41.003 MATH MEM = MEM * 1000 41.004 MEME 41.005 MEMC 30 mA 0.2% 0.1/ 1kH #! Test Tol 9e-005, Sys Tol 8.5e-006, T.U.R. 10.588 (>= 4.00). 42.001 IEEE RNG 3 42.002 5700 2.000A 40H S 2W 42.003 IEEE X[I]X[I] 42.004 MEME 42.005 MEMC 3 A 0.2% 0.1/ 40H #! Test Tol 0.007, Sys Tol 0.00134, T.U.R. 5.224 (>= 4.00). 43.001 5700 2.000A 400H S 2W 43.002 IEEE X[I]X[I] 43.003 MEME 43.004 MEMC 3 A 0.2% 0.1/ 400H #! Test Tol 0.007, Sys Tol 0.00134, T.U.R. 5.224 (>= 4.00). 44.001 5700 2.000A 1kH S 2W 44.002 IEEE X[I]X[I] 44.003 MEME 44.004 MEMC 3 A 0.2% 0.1/ 1kH #! Test Tol 0.007, Sys Tol 0.00134, T.U.R. 5.224 (>= 4.00). 45.001 MMFC C1 45.002 END #! T.U.R.s less than 4.00: 1 #! T.U.R.s estimated using RANGE value: 0 #! T.U.R.s not calculated (ASK- U): 0 #! T.U.R.s not computable at compile time: 0 #! FOR JUSTIFICATION REFER TO COMMENTS FOLLOWING EACH TEST IN THIS LISTING.